Skenovací elektronový mikroskop Nova NanoSEM 450
The Nova NanoSEM 450 (FEI) is a modern field-emission scanning electron microscope with 1 nm ultimate resolution, large sample chamber with, advanced motorized stage, and navigation supported by an in-chamber camera. High- and low-vacuum operations are possible. Several detectors (ETD, TLD, LVD, GAD, STEM II) are available to observe secondary and backscattered electrons under various conditions and also to obtain STEM images. The microscope is also equipped with an EDS detector for elemental composition analysis (EDAX), Elphy Plus nanolithography station (Raith) and a set of piezoelectric MiBot micromanipulators (Imina).
Umístění
Další instrumenty z této kategorie
The Jeol JEM-2100PLUS is transmission electron microscope in cryogenic configuration. It is equipped with a high-tilt cryo-transfer sample holder and TVIPS TemCam-XF416 CMOS camera. The setup is suitable for basic screening for single particle analysis, electron tomography and electron diffraction. The implemented SerialEM software provides a wide range of presets for automated image acquisition, montage mapping and tomography in low-dose conditions. The microscope is completely suitable for room temperature applications.
The VEECO Nanoscope V is AFM (atomic force microscope) system for detection of single molecules, molecules in monolayers and molecular grids. This is useful for following the progress of our efforts to develop methods for the construction of two-dimensional arrays for mounting molecular rotors.
